报告题目：Surface analysis of technological relevant samples

报告人：Andreas Thissen博士（德国SPECS公司）

时间：2008年4月23日 上午9：00

地点：B203会议室

报告摘要：

Electronic devices have revolutionized everyday life in industrial countries over thelast decades. Recently two main tasks for research and development are dominant:
miniaturization for sophisticated applications targetting at the nanoscale, and
designing low cost large scale devices. In both fields the device performance is
strongly determined by materials’ quality, composition, combination and last but not
least by processes at materials’ interfaces. Nanostructures, minimization of material
consumption and the need to improve device efficiencies consequently leads to the
widespread focussing on thin film preparation. For thin film devices surface and
interface analysis like photoelectron spectroscopy and STM is an important tool for
material and device characterization. Classical well defined model experiments
already reveal important insights using highly integrated vacuum systems for analysis
and preparation. But analysis of materials and devices under near environmental
conditions and even in situ during operation is an inevitable future development to
improve the significance of data for development and quality management. In this
respect techniques like high temperature STM, high pressure STM and XPS, XPS
from liquids and hard x-ray PES (HAXPS) are some of the challenging tasks for
manufacturing companies for surface analytical equipment.

报告人简介：

Andreas Thissen博士一直在德国高等院校从事科研教学工作，主要研究领域为与太阳能
电池相关的纳米技术。是SPECS 公司成员。在2006 年秋天加入德国SPECS公司。

请与表面分析技术相关的科研人员、研究生积极参加报告会！

科技发展部 4月20日